General Light Microscopy
Nikon Eclipse 800 with Pixera Pro 600ES and Nikon
Coolpix 995 digital cameras.
Capabilities are bright field (Köhler)
illumination, dark
field, Nomarski
(DIC) (high resolution only) and fluorescent
filters UV-2A (330-380nm > 420LP); BV-2A (400-440 > 470LP);
G-2A (510-560nm > 590LP); FITC (465-495nm > 515-555nm).
Nikon Microphot-SA (1) with 35mm film and with Nikon
Coolpix 990 digital cameras.
Capabilities are bright field (Köhler)
illumination, and fluorescent
filters DAPI (365nm > 418-483nm); Rhod (546nm > 590LP);
FITC (450-490nm > 520LP).
Nikon Microphot-SA (2) with 35mm
film and with Nikon Coolpix 990 digital
cameras.
Capabilities are bright field (Köhler)
illumination , dark
field, phase
contrast (No. 1 & 3 phase rings), Nomarski
(DIC) and fluorescent
filters DAPI (330-380nm > 450LP); Rhod (546nm > 590LP);
FITC (450-490nm > 520LP).
Leica Stereo-Fluorescence microscope
Fluorescent filters UV
(340-380nm>420LP), GFP2 (460-500nm > 510LP) and GFP3 (450-490nm > 500-550nm).
Cairn CCD system
Nikon Eclipse 600 with Hamamatsu Orca HQ cooled
CCD digital camera.
The system has a motorised XY stage, Z focus drive, automated
fluorescence filters and electronic shutters on both bright-field
and UV light sources. The system is computer controlled via
MetaMorph software and is capable of doing bright field (b/w),
multi-colour fluorescence, z-series, time lapse and multi-stage
position imaging. The fluorescence filters
available on the system can been seen in the table below.
Excitation Filter (nm) |
Emission Filter (nm) |
340-380 |
425-475 |
397-409 |
455-495 |
417-443 |
509-547 |
480-500 |
520-550 |
490-510 |
580-654 |
541-569 |
665-705 |
625-645 |
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Confocal Microscopy
Leica SP .
The confocal
scan head is mounted on a Leica DMR upright microscope
and has three tuneable fluorescence detectors (400-800nm);
plus three excitation lasers: Argon ion (457, 477, 488, and
514nm), Green HeNe (543nm) and Red HeNe (633nm), which can
be used with a wide range of visible dyes (acquired 1998).
Leica SP2
The confocal
scan head is mounted on a Leica DM IRB inverted microscope
and has three tuneable fluorescence detectors (400-800nm);
plus four excitation lasers: Violet laser diode(405nm), Argon
ion (457, 477, 488, and 514nm), Green HeNe (543nm) and Red
HeNe (633nm) which can be used with a wide range of UV and
visible dyes (acquired 2000).
VisiTech spinning disc
This system is a lower resolution confocal microscope and
is better suited for for fast image acquisition (sample dependant)
and imaging living cells for extended periods of time. System
is computer controlled via MetaMorph software and is capable
of doing bright field (b/w), multi-colour fluorescence, z-series,
time lapse and multi-stage position imaging. The confocal
scan head is mounted on a Nikon E800 upright microscope and
has a Hamamatsu Orca ER cooled CCD detector. The system has three
excitation lasers: Violet laser diode(405nm), Argon
Ion (457, 488, 514nm), Argon Krypton laser 568 and 647nm)
and emission
filters [432-482nm, 465-505nm, 500-550nm, 520-550nm,
580-654nm, 662-738nm], which can be used to image a wide
range of UV and visible dyes (acquired 2003).
Zeiss 510 META
confocal
The newest confocal microscope at JIC (installed around Easter
2007), is the Zeiss LSM 510 META which is a high-end laser
scanning microscope from Carl Zeiss. A completely new detection
technology overcomes the limits of existing detection methods.
The new system allows many more fluorescent markers to be
used simultaneously and their fluorescent emissions to be
assigned despite spectral overlaps. The LSM 510 META thus
specifically addresses the growing need of users in biomedical
research to discover the complex relations and interactions
between cellular structures and components and to trace them
in living cells or tissues. This milestone development is
based on a confocal detection technique combining innovative
detector technology with intelligent analytical methods.
By splitting the fluorescent light and projection onto a
multi-channel detector, the LSM 510 META delivers the spectral
distribution of the fluorescence signals as a parameter of
every pixel in the object under investigation. In a second
step, this information can be used for the digital separation
of the fluorescence emissions in a multifluorescence experiment.
All functions needed for this are provided by the user-friendly
LSM 510 META software.
Transmission
Electron Microscopy
The transmission electron microscope uses a beam of electrons,
controlled by electromagnetic lenses, to image very thin
samples – usually sections of around 100nm – which
the beam has to pass through. To provide contrast, the specimen
is usually stained with heavy metals such as lead and uranium.
Such heavy metals will absorb or scatter the electrons, thus
removing them from the primary beam as it passes through
the sample, and before it can strike a phosphor screen. When
the resultant electron beam hits the screen it gives off
visible light, thereby forming an image that we can see.
We have an FEI Tecnai G2 20 Twin TEM. This is a 200 KV instrument installed in spring 2008. It is suitable for all routine TEM specimens on 3.05 mm grids, such as negatively stained samples and immunogold labelled sections. It is fitted with two Deben digital cameras; a 1.3 megapixel AMT HRL side-mounted system and a 4k AMT XR60M CCD bottom-mounted camera, both for collection of TIFF digital image files. It has a LaB6 filament as the electron source and also has a dual-axis, high-tilt, holder suitable for electron tomography of thick resin sections to 70° tilt. There is an additional support computer in the Bioimaging facilities with FEI's Inspect3D Xpress software for post-acquisition processing and reconstruction of the tomograms acquired on the microscope. The resolution of our TEM is considerably better than the SEMs, with a line resolution of 0.144nm.
Sectioning facilities
We have two ultramicrotomes for ultra-thin (approx 100nm)
sectioning for the TEM's and semi-thin (approx 0.5 micron)
resin sectioning for light microscopy. The older, Reichert-Jung
machine is an Ultracut E (acquired around 1985), is for general
use and has an attachment for cryo sectioning. The second
machine is a Leica UC6 with a touchscreen computer to operate
the controls (purchased in 2004). In the same room, there
is a Leica knife-maker (KMR2) apparatus (acquired 2000) and
a hot-wax plate for preparing glass knives, aswell as two
light microscopes (a Leica MZ16 and a Vickers) for checking
samples and slides.
Next door, there are two Leica Autocut microtomes (an RM
2125RT and an RM 2055) for making thick sections (from wax,
Historesin or Technovit embedded material) for light microscopy
work (up to 25 microns). There is also a large hotplate and
a light microscope for drying and checking slides.
There are two standard embedding ovens for routine heat
polymerisation of resin-infiltrated material used for ultrastructural
studies. We also have a "cold
box" apparatus designed for low temperature embedding,
which has been shown to improve antigenicity and is therefore
always used when immuno-labelling studies are required for
the TEM.
Grid preparation
An EdwardsAuto 306, high-vacuum metal coating unit (acquired
2002) for low-angle rotary shadowing and carbon-coating grids,
plus an electric grinding machine for preparation of the
necessary carbon rods.
See further information on Embedding
and Sectioning.
Cryo-techniques
One of the Reichert
microtomes in the sectioning room has an attachment
for cryo-ultramicrotomy using the Tokuyasu technique (first
cryoprotecting aldehyde fixed samples with sucrose).
Both the SEM's are fitted with cryo-stages so that samples
can be cryo-fixed and imaged in the SEM whilst in the frozen-hydrated
state.
Scanning Electron Microscopy
The scanning electron microscopes at JIC are used for looking
at surfaces of samples, providing images of three-dimensional
objects with a greater depth of focus than a light microscope
and a maximum resolution of around 2nm.
In the SEM, the sample is coated with a thin layer of metal
(known as sputter coating) and scanned by an electron beam,
which is brought to a focus on the sample by means of the
electromagnetic lenses. The resultant secondary electrons
(SE’s) that are emitted from the sample surface are
measured by the SE detector and are used to control to the
intensity of successive points in an image built up on a
monitor. We also have a backscattered electron detector which
can be used for collection of atomic number composition of
a sample.
Philips XL30 FEG
This SEM (acquired 1996) has a field emission electron
gun (FEG) for high resolution, with an Oxford Instruments
CT1500 HF cryo-stage for cryo-fixed samples and freeze-fracture work.
This instrument is equipped with a 120 roll film camera for
analogue image capture, but can also capture digital images
of up to a maximum of 3k by 4k pixels. The system is computer
controlled and fully networked to permit easy transfer of
images.
Zeiss Supra 55 VP FEG
A second high-resolution SEM was installed in 2004. It
is a Zeiss Supra 55 VP FEG SEM with a Gatan Alto 2500
cryo system for cryo-fixed samples and freeze-fracture
work. It also has a Deben CoolStage which is basically
a Peltier stage and can be used to hold samples at specific
temperatures in the range +50°C to -25°C. The microscope also
has variable pressure (VP) mode which allows imaging at low
vacuum (in the range 2-133Pa). This, in combination with
the CoolStage, helps reduce charging artefacts and permits
some samples to be imaged without sputter-coating and at
ambient, or close to 0°C, temperatures which would otherwise
have had to be cryo-fixed if imaged at high vacuum, such
as insects and even some leaves.
When working in VP mode, the microscope uses a special
detector (VPSE) for imaging. In addition to the normal secondary
electron (SE) detector, there is also an in-lens detector
and therefore this microscope offers higher resolution than
our other SEM. It has no camera so all images must be captured
digitally. The system is fully computer-controlled and has
a CD-writer for users to write their images to a CD before
leaving the microscope room.
Other SEM equipment
A critical point dryer apparatus used for drying chemically
fixed samples.
An Agar, high resolution sputter-coater apparatus with
planetary-motion stage, specifically for coating samples
for high-resolution, field emission scanning electron microscopy
(acquired 2000).
Miscellaneous
Linkam PE120
system: temperature controlled stage (-25
to 120oC) for upright optical microscopes with a Prior
motorised stage.
Two 200 litre self-pressurising liquid nitrogen tanks to
provide a supply of nitrogen required by much of the above
EM apparatus.
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